THz Fabry-Pérot Etalon THz F-P Etalon TFPE

THz Fabry-Pérot Etalon THz F-P Etalon TFPE
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THz Fabry-Pérot Etalon THz F-P Etalon TFPE

Product Introduction

The THz Fabry-Pérot Etalon (TFPE) launched by Tera photoelectric Technology is a high-resistance silicon plate with a specific spacing on its reflective surface. The standard prism made of high-resistance silicon material has better surface flatness and parallelism. The thickness of the standard prism is the result of high-precision testing.

Main Specification

Material

HRFZ-Si

Type

THz F-P Etalon

Diameter

25.4-150mm

Clear Aperture

≥90%

The THz Fabry-Pérot Etalon can serve as a thickness reference value and can be applied in the thz time-domain spectrometer (THz-TDS) system as a calibration reference for the system. It can be used to adjust the narrow-band thz source and can also be utilized in the application of testing thickness in the thz frequency band using the thz spectroscopy method.

Application Case

Calibrate the thz time-domain spectrometer (THz-TDS) to accurately measure the thickness of the sample

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In the experiment, the transmittance spectrum of the THz Fabry-Pérot Etalon (TFPE) was tested. Based on the refractive index (3.416) of the high-resistance silicon material, the thickness of the TFPE could be accurately calculated. The measured thickness value was consistent with the value in the test report. Any deviation would indicate that the TDS system needs adjustment.

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The transmittance spectrum of the THz Fabry-Pérot Etalon (TFPE) in the 0.5 - 1 THz frequency range, with a thickness of 3.042 mm

The THz Fabry-Pérot Etalon product specifications

Model

Diameter

Nominal Thickness

Actual Thickness

Free Spectral Range

Bandwidth

Precision

TEFP-HRFZ-Si-D25.4-T3

25.4mm

3mm

3.042mm

14.4GHz

5.5GHz

2.6

1)Actual Thickness:The exact measured thickness, with an accuracy of 0.001mm.

2)Free spectral range:It is the frequency compensation between the longitudinal modes of the THz Fabry-Pérot Etalon (TFPE), and it can be calculated based on the speed of light c, the length l of the standard device, and the refractive index n of high-resistance silicon.

3)The precision is the ratio of the free spectral range to the bandwidth. F = (2∙π) / (-ln (R^2)) , where R is the reflection coefficient of TFPE.

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